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  A Deep Convolutional Neural Network for Wafer Defect Identification on an Imbalanced Dataset in Semiconductor Manufacturing Processes Stable

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  A Deep Convolutional Neural Network for Wafer Defect Identification on an Imbalanced Dataset in Semiconductor Manufacturing Processes

  https://ieeexplore.ieee.org/document/9093073

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  • 3.5 MiB (최종)참고자료_논문_Wafer Map 불량검출_번역.pdf
  • 1.3 MiB ADeepConvolutionalNeuralNetworkforWafer.pdf